Statistical Analysis and Modelling of Spatial Point Patterns: From Spatial Data to Knowledge

Illian, Janine Penttinen, Antti Stoyan, Dietrich Stoyan, Helga

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Éditeur
Wiley-Blackwell (an imprint of John Wiley & Sons Ltd)
Pages
560
Parution
janvier 2008
Format
Cartonné
Langue
Anglais
Dimensions
235 × 162 × 34 cm
EAN
9780470014912
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  • Résumé

Spatial point processes are mathematical models used to describe and analyse the geometrical structure of patterns formed by objects that are irregularly or randomly distributed in one-, two- or three-dimensional space.
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