Identification of Defects in Semiconductors

Collectif

Ouvrage indisponible

Éditeur
Academic Press Inc
Pages
376
Parution
juillet 1998
Format
Cartonné
Langue
Anglais
Dimensions
229 × 152 × 25 cm
EAN
9780127521596
  • Résumé

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.
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