Hot-carrier Effects in MOS Devices

Takeda, Eiji Yang, Cary Y. Miura-Hamada, Akemi

Ouvrage indisponible

Éditeur
Academic Press Inc
Pages
312
Parution
novembre 1995
Format
Cartonné
Langue
Anglais
Dimensions
229 × 152 × 18 cm
EAN
9780126822403
  • Résumé

The exploding number of uses for ultra fast, ultra small integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. This work encompasses the research and discoveries made in the fast-paced area of hot carriers, and also includes the basics of MOS devices.
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