Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Tsong, Tien T.

Ouvrage indisponible

Éditeur
Cambridge University Press
Pages
400
Parution
septembre 2005
Format
Livre broché
Langue
Anglais
Dimensions
228 × 152 × 21 cm
EAN
9780521019934
  • Résumé

The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.
Bio de l'auteur
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