Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution

Tsong, T.T.

Ouvrage indisponible

Éditeur
Cambridge University Press
Pages
400
Parution
septembre 2005
Format
Livre broché
Langue
Anglais
Dimensions
228 × 152 × 21 cm
EAN
9780521019934
  • Résumé

The book will be of interest to scientists working on surfaces and interfaces of materials at the atomic level and will provide a useful reference for those using this technique.
Bio de l'auteur
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